EDX-3 Portable X-ray Fluorescence Spectrometer | XRF Metal Analyzer | Alloy Composition Tester

EDX-3 Portable X-ray Fluorescence Spectrometer | XRF Metal Analyzer | Alloy Composition Tester

Product No: EDX-3

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    Description

    The EDX-3 Portable X-ray Fluorescence Spectrometer | XRF Metal Analyzer | Alloy Composition Tester enables rapid, accurate, and non-destructive measurement and identification of various alloy grades in atmospheric conditions. This instrument is designed for compliance with ISO 3497:2023 standards for X-ray fluorescence spectrometric analysis of metallic materials.

    EDX-3 Alloy Element Analysis Specification:
    • Elemental Analysis Range: Capable of analyzing all elements in the Periodic Table from 16-S to 92-U, including iron, copper, stainless steel, Au (gold), Pt (platinum), and other metallic elements.
    • Alloy Grade Database: Integrated grade database containing over 400 standard alloy grades. Supports standard classification systems including GB/T and UNS specifications. Users can create custom databases accommodating over 1000 additional alloy grades.
    • Detector System: High-precision Si-pin detector with energy resolution ≤145eV.
    • Excitation Source: 50kV/200μA microfocus X-ray tube with Ag target, integrated high-voltage power supply, total power consumption ≤4W.
    • Measurement Performance: Alloy grade identification within 5 seconds, quantitative elemental analysis within 20 seconds. Detection limits at ppm levels with relative standard deviation (RSD) <5%. • Display Interface: Integrated 5-inch high-performance LCD touch screen with fixed-angle design, optimized for industrial environments without PDA or tablet computer integration. • Processing System: Quad-core processor operating at ≥1.4GHz, ≥4GB RAM, ≥64GB onboard storage capable of retaining over 200,000 measurement datasets and spectral records. • Operating System: Industrial-grade customized operating system supporting seamless data export to common office software formats without conversion requirements. • Data ... (truncated)