RoHS Compliance EDXRF Analyzer – Element Analysis – Thickness Gauge

The EDX-2 series energy dispersive X-ray fluorescence spectrometer operates by analyzing the characteristic X-ray wavelength and intensity emitted by sample elements. Element identification is based on distinct X-ray wavelengths, while element concentration is determined by comparing spectral intensities. Specifications:

• Models: EDX-2A, EDX-2AC, EDX-2AB, EDX-2ABC, EDX-2T
• Type: Non-pumping air desktop, Vacuum desktop
• Weight: 50KG, 55KG
• Test Time: 200S, 100S
• Sample Cavity Size: 610*320*100mm (L*W*H), 510*310*120mm (Non-vacuum), Ф100*70mm (vacuum)
• Test Environment: Atmosphere, Vacuum
• Detector: Si-pin, SDD
• Resolution: 149 Electronic Volt, 129 Electronic Volt
• Output Tube Pressure, Current: 50KV/600uA (Automatic Setting)
• Test Sample Type: Solid, Liquid, Powder; Non-vacuum: Solid, Liquid, Powder; Pumping Vacuum: Solid
• Content Analysis Range: 2ppm–99.99%

Applications:

• RoHS Directive Testing
• Coating and Plating Thickness Measurement
• Alloy Analysis

Element Range: All elements from 16-S to 92-U for alloy analysis including iron, copper, stainless steel, Au (gold), Pt (platinum), etc.