IEC 61032 Test Probe 18 8.6mm Small Finger Probe

The IEC 61032 Test Probe 18 8.6mm Small Finger Probe is engineered to simulate potential access by children aged 36 months to 14 years to hazardous parts in electrical equipment, in accordance with IEC 61032 Figure 12. It incorporates a knurled metal probe with an 8.6mm diameter to replicate realistic contact scenarios, coupled with an insulating handle for operator safety. A 451.6mm handle extension, designed to mimic a child’s arm reach, is provided, with both joints capable of 90° articulation within the same plane and direction—essential for evaluating worst-case access conditions. Note: This probe does not include an electrical cable; a cabled variant is available separately for low-voltage testing applications. The probe is compliant with international safety standards, including IEC 61032, to mitigate electrical and mechanical hazards to children.

Specifications:
• Probe Type: IEC 61032 Test Probe 18 (small finger probe for child access simulation)
• Knurled Finger Diameter: 8.6 mm ± 0.1 mm
• Probe Head Radius: 4.3 mm ± 0.05 mm (hemispherical tip)
• Knurled Finger Length: 57.9 mm ± 0.15 mm (3 knurls, 19.3 mm per knurl)
• Handle Extension Length: 451.6 mm ± 0.8 mm (simulates child arm reach)
• Collar Diameter: 38.4 mm ± 0.3 mm
• Joint Movement: 90° articulation in the same plane and direction (both joints)
• Material Probe: Metal (knurled surface for realistic simulation); Handle: Insulating material
• Cable Inclusion: None (cabled version available for low-voltage testing)
• Core Function: Simulates access by children (36 months – 14 years) to hazardous parts in equipment per IEC 61032

Test Procedures:
• Inspect the probe for any damage, such as deformation of the knurled finger or cracks in the handle.
• Attach the 451.6mm handle extension when assessing worst-case access scenarios.
• Configure the joints to a 90° angle to replicate child hand articulation.
• Methodically guide the probe tip toward potential access points of hazardous components.
• Determine if the probe makes contact with any hazardous parts.
• Document the test outcome as pass or fail based on equipment’s ability to prevent child access.

Applications:
• Child access testing for household appliances (e.g., televisions, washing machines) compliant with IEC 61032 Figure 12.
• Safety verification of child-oriented electronic devices (e.g., educational tablets, portable gaming consoles).
• Compliance assessment of small kitchen appliances (e.g., mini blenders, toaster ovens) to prevent mechanical and electrical risks to children.
• Testing of toy-related electrical products (e.g., battery-powered ride-on toys) with accessible openings per safety standards.
• Quality assurance for commercial equipment in child-accessible areas (e.g., playzone fans in malls, classroom electronics).

IEC 61032 Test Probe 18 8.6mm Small Finger Probe

Tags：IEC 61032 , SMT-1218