MOSFET Parameter Test Selector

MOSFET Parameter Test Selector

Product No: UI9611

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    Description

    The MOSFET Parameter Test Selector performs comprehensive parameter measurement and fault detection for metal-oxide-semiconductor field-effect transistors in accordance with IEC 60747-8 standards.

    Measurement Parameters

    • Threshold voltage UGS(th)
    • On-state resistance RDS(on)
    • Transconductance gm
    • Drain-source breakdown voltage V(BR)DS

    Technical Specifications

    • Test ranges: UGS(th) 0.1-9.9V; RDS(on) 0.001-9.999Ω; gm 0.10-10.00S; V(BR)DS 50-650V
    • Test current range: 0.1A-5A adjustable for various operating conditions
    • High-current RDS(on) measurement technology for accurate on-resistance characterization
    • Automated component selection with out-of-specification alarm functionality
    • Enhanced testing efficiency through automated parameter measurement and classification

    This instrument supports quality control processes in semiconductor manufacturing, component verification, and failure analysis applications.