Transistor Multi-Functional Selector

The Transistor Multi-Functional Selector provides comprehensive parameter analysis in compliance with IEC 60747-2 standards for semiconductor device testing. This instrument delivers precise measurement capabilities for critical transistor characteristics required for quality assurance and engineering validation.

Measurement Parameters

• Current gain β (0-99)
• Switching time parameters (0.01μs-99.9μs): Rise time (Tr), storage time (Ts), fall time (Tf)
• Saturation voltages: Collector-emitter saturation voltage VCES (0-2V), Base-emitter voltage VBE (0-2V)
• Leakage current ICEO (0.1μA-3mA)
• Breakdown voltage BVCEO (50V-650V)

Testing Capabilities

The analyzer features pre-configured grouping values for switching time and current gain parameters. During measurement, the instrument displays group classification and provides audible/visual alarms when measured values exceed established limits for VCES, VBE, ICEO, or BVCEO parameters, with specific indication of non-conforming items.

Configurable Test Conditions

• Three base current settings for β measurement: 0.1mA, 1mA, 10mA
• Four collector current configurations for switching time analysis: 0.5A, 0.25A, 0.1A, 0.05A with corresponding base currents of 0.1A, 0.05A, 0.02A, 0.01A
• Adjustable test voltage for ICEO leakage current measurement: 50-650V continuously variable

System Features

The instrument supports user-defined grouping and limit value configurations with automatic data preservation during power interruption. The system maintains 20 distinct configuration profiles for rapid test setup selection. Four simultaneous measurement displays provide comprehensive parameter visibility with data logging and printing capabilities.

Tags: Transistor Multi-Functional Selector, UI9600A, Semiconductor Test Equipment