IEC 61032 Compliant Articulated and Rigid Test Probes

The Articulated Test Probe and Rigid Test Probe are precision testing instruments manufactured in accordance with Figure 2 (Test Probe B) and Figure 7 (Test Probe 11) specifications within IEC 61032. These probes simulate human finger access for compliance verification per IEC, UL, CSA, IRAM, and related international safety standards.

1) IEC Articulated Test Probe 2 (Test Probe B per IEC 61032): LISUN model is SMT-IP20T
Probe Diameter: 12 mm
Probe Length: 80 mm
Baffle Plate Thickness: 20 mm
Baffle Plate Diameter: 50 mm
Baffle Plate Length: 100 mm

2) IEC Rigid Test Probe 7 (Test Probe 11 per IEC 61032): LISUN model is SMT-1175
Probe Diameter: 12 mm
Probe Length: 80 mm
Baffle Plate Thickness: 5 mm
Baffle Plate Diameter: 50 mm

Compliance Standard:
IEC 61032 “Protection of persons and equipment by enclosures – Probes for verification”

IEC Articulated Test Probe 2 (Test Probe B per IEC 61032)