IEC 61032 Figure 1 Probe A: 50mm Sphere IP1X Test Probe with 50N Thrust

This 50mm spherical IP1X test probe, designated as Test Probe A per IEC 61032 Figure 1, serves as a critical instrument for electric shock protection verification of household and similar electrical appliances.
Engineered to comply with IEC 61032 Figure 1 (Test Probe A) specifications, it incorporates an integrated baffle and ergonomic handle to ensure stable, secure operation during testing procedures. The 50mm spherical probe simulates large foreign object access to validate that hazardous internal components remain inaccessible—confirming appliances meet IP1X enclosure protection requirements and international safety standards including GB/T 4208-2008.

Specifications:
• Ball Diameter: 50mm
• Baffle Plate Diameter: 45mm
• Baffle Plate Thickness: 4mm
• Handle Diameter: 10mm
• Handle Length: 100mm
• Compliance: IEC 61032 Figure 1 (Test Probe A), Table 6 GB/T 4208-2008 first characteristics (1)
• Thrust Range: 10N/20N/30N/40N/50N

Test Procedures:
• Verify probe structural integrity, calibrate thrust force (10N–50N range), and prepare the de-energized, clean test appliance.
• Align the probe’s 50mm spherical tip with appliance openings, maintaining baffle perpendicularity to the probe axis.
• Apply calibrated thrust force steadily and systematically test all critical access points from multiple orientations.
• Determine if probe contacts hazardous components, assess compliance status, and document test results.
• Clean probe surfaces post-testing and store in controlled environmental conditions.

Applications:
• IP1X enclosure protection testing for household electrical appliances.
• Electric shock prevention compliance verification for similar electrical devices.
• Simulation of large foreign object access to hazardous internal components.
• Safety standard validation aligned with IEC 61032 Figure 1 and global regulations.
• Pre-market or quality control testing for appliance safety compliance.